Publications / 2025 / Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction

Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction

L Cao, R Zhou, X Wang, Wei Pan
*Measurement Science and Technology*, 36(11):115206
— Versions
[journal]
Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction *Measurement Science and Technology*, 36(11):115206
[conference]
Volume Measurement Technology of Dispensing Transparent Adhesives Based on Line Laser Scanning 2025 10th International Conference on Image, Vision and Computing (ICIVC), 542-547
— Summary

Transparent adhesives pose a fundamental difficulty for structured light and line laser measurement: the material scatters and refracts the illumination internally, producing multiple false stripe peaks and erroneous centroid estimates. Standard centroid extraction algorithms assume a single dominant peak and fail under these conditions, leading to large volume errors. This paper resolves the problem in two complementary steps. First, a spectral optimisation procedure selects the laser wavelength at which the adhesive has maximum absorption, minimising internal scattering. Second, an enhanced centroid extraction algorithm robustly identifies the true surface return even when secondary reflections are present. The integrated system is validated across a range of adhesive types, bead volumes, and substrate materials representative of automotive and consumer electronics assembly lines. Published in Measurement Science and Technology (2025), the work demonstrates sub-millimetre volumetric accuracy and provides a practical, drop-in replacement for existing line laser inspection stations without requiring hardware redesign.

This journal page also groups the earlier ICIVC 2025 conference version, which introduced the transparent-adhesive volume-measurement workflow based on line laser scanning.

Problem setting

Measuring the volume of transparent adhesive beads on production lines is a critical quality-control challenge because conventional line laser scanners suffer from light scattering and specular reflections inside the adhesive, corrupting the detected laser stripe centroid. This work addresses this by selecting an optimised laser wavelength that maximises absorption contrast within the adhesive, paired with an enhanced centroid extraction algorithm that suppresses multi-reflection noise. The resulting system achieves sub-millimetre volume accuracy on transparent adhesive samples across varying bead sizes and surface conditions.

The figures below collect representative visual evidence from Measurement Science and Technology, 36(11):115206.

Method and visual evidence

The figures below summarize the paper’s workflow and representative visual evidence.

Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction - Method overview

Method overview.

Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction - Representation and setup

Representation and setup.

Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction - Experimental evidence

Experimental evidence.

Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction - Result comparison

Result comparison.

Precision 3D volume measurement of transparent adhesives via spectrally optimized line laser scanning and enhanced centroid extraction - Additional visual result

Additional visual result.

Results and impact

The evaluation reported in Measurement Science and Technology, 36(11):115206 is summarized through the figures above.

Type
Article Journal
Topic
Industrial Inspection
Venue
*Measurement Science and Technology*, 36(11):115206
Year
2025
DOI